Description
Specification
| Sample Handling | |
|---|---|
| Sample Loading | External sample loading |
| Sample holders | Variety of full-sized sample holders capable meeting all requirements |
| Sample changing | 6-position full-sized sample changer |
| Automation | Compatible with automation integration |
| X-ray Generation | |
| Wavelengths | Cu or Co |
| Tube setting | From 300 W to 600 W options in 30 kV or 40 kV setting |
| Tube housing | Patented design with Corrosion-resistant incident smart beam path technology (CRISP)*. *CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2. |
| Goniometer | |
| Configuration | Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal |
| Geometry | Bragg-Brentano, Transmission, Grazing Incidence |
| Radius | 145 mm |
| Maximum 2θ range | -4° < 2θ ≤ 142° (with scanning detector and full active length) |
| Angle positioning | Direct optical position sensing (DOPS3) with lifetime positioning accuracy |
| Scan Speed | Max 2.17°/s |
| Achievable resolution | < 0.04° 2θ on LaB6 (with 0.01 rad Soller slits) |
| 2θ linearity | < 0.04° 2θ |
| Smallest addressable increment | 0.001 degree |
| Stages | |
| Spinning | Choice of spinner stages |
| Non-Ambient | Heating stage option (BTS-500, BTS-150) |
| Exchange of stages | Alignment-free PreFIX exchange of stages |
| Special stages | On request (manual, MPSS, In-Situ) |
| Detectors | |
| Detector | Choose between the PIXcel1D, PIXcel3D and 1Der detectors |
| General | |
| Dimensions (H x W x D) | 690 mm x 770 mm x 786 mm/ 27-inch x 30 inch x 31 inch |
| Dust protection | Closed system with external sample loading |
| External cooling water supply | Not needed |
| Compressed air supply | Not needed |
| Power supply | 100 – 240 V, single phase |
| Computer | Internal instrument PC |
| Operation | Intuitive user interface with 10.4” touch screen |
| Interfaces | LAN, USB, HDMI |
